We offer thermal property characterization services and consulting for a wide range of samples to support your research and development.
Sample Mapping – We can map a variety of thermal properties across a sample with micron-scale resolution.
Temperature-Dependent Measurements – Showing how thermal properties vary over a wide range of temperatures.
Defect Analysis in Bonded Systems – We can quantify thermal boundary resistance and reveal the quality of bonds between materials such as silicon, diamond, silicon carbide, and gallium nitride.
